• DocumentCode
    3793511
  • Title

    Introduction to the Special Issue on the 2005 International Integrated Reliability Workshop

  • Author

    J.F. Conley;Y. Chen;B. Knowlton;T. Sullivan;B. Tonti

  • Volume
    6
  • Issue
    2
  • fYear
    2006
  • Firstpage
    115
  • Lastpage
    116
  • Keywords
    "Special issues and sections","Materials reliability","Conferences","Semiconductor device reliability","Threshold voltage","Lakes","MOSFET circuits","Bonding","Hafnium oxide","Electrons"
  • Journal_Title
    IEEE Transactions on Device and Materials Reliability
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2006.877374
  • Filename
    1673697
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3793511