مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3793914

Title :

The Legacy of Moore´s Law

Author :

F.T. Ulaby

Volume :

Issue :

fYear :

2006

Firstpage :

1251

Lastpage :

1252

Keywords :

"Moore´s Law","Silicon","Semiconductor device measurement","Costs","Tunneling","Electrons","Manufacturing industries","Multicore processing","Roads","Atomic measurements"

Journal_Title :

Proceedings of the IEEE

Publisher :

ieee

ISSN :

0018-9219

Type :

jour

DOI :

10.1109/JPROC.2006.876941

Filename :

1677941

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3793914