3795317

Comments on the Critique of Lee, Lloyd, and Shrivastava

T.F. Gannon;S.D. Shapiro

Manufacturing Data Systems, Inc.

6

1981

610

611

"Fault tolerant systems","Testing","System performance","Hardware","Computer errors","Computer science","Fault tolerance","Electronic switching systems","Software reliability","Digital systems"

IEEE Transactions on Software Engineering

ieee

0098-5589

jour

10.1109/TSE.1981.226471

1702894