DocumentCode
3795317
Title
Comments on the Critique of Lee, Lloyd, and Shrivastava
Author
T.F. Gannon;S.D. Shapiro
Author_Institution
Manufacturing Data Systems, Inc.
Issue
6
fYear
1981
Firstpage
610
Lastpage
611
Keywords
"Fault tolerant systems","Testing","System performance","Hardware","Computer errors","Computer science","Fault tolerance","Electronic switching systems","Software reliability","Digital systems"
Journal_Title
IEEE Transactions on Software Engineering
Publisher
ieee
ISSN
0098-5589
Type
jour
DOI
10.1109/TSE.1981.226471
Filename
1702894
Link To Document