• DocumentCode
    3795587
  • Title

    VLSI Designer´s interface

  • Author

    D.W. Bouldin

  • Volume
    22
  • Issue
    4
  • fYear
    2006
  • Firstpage
    8
  • Lastpage
    9
  • Keywords
    "Very large scale integration","Web server","Circuit testing","Circuit faults","Internet","Routing","Systolic arrays","Integrated circuit technology","Semiconductor device measurement","Integrated circuit measurements"
  • Journal_Title
    IEEE Circuits and Devices Magazine
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/MCD.2006.1708369
  • Filename
    1708369
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3795587