• DocumentCode
    3795812
  • Title

    Double-interdigitated power transistors

  • Author

    A.P. Silard;G. Nani;F. Floru;C. Stefan

  • Author_Institution
    Dept. of Electron., Polytech. Inst., Bucharest, Romania
  • Volume
    35
  • Issue
    8
  • fYear
    1988
  • Firstpage
    1364
  • Lastpage
    1371
  • Abstract
    The results of a comprehensive investigation concerning the implementation of the double-interdigitated (TIL) concept in TO-3-packaged triple-diffused power n-p-n/sup -/-n transistors are reported. The ease of manufacturing is accompanied by a relaxation of the tradeoff between the doping and width of the p-base and the main transistor parameters, which is still a crucial issue in conventionally interdigitated switches. The advantages exhibited by TIL devices when compared with identical conventional interdigitated transistors processed simultaneously are discussed.
  • Keywords
    "Power transistors","Electrothermal effects","Voltage","Switches","Silicon","Delay","Costs","Manufacturing","Equivalent circuits"
  • Journal_Title
    IEEE Transactions on Electron Devices
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.2560
  • Filename
    2560