Title :
Analog checkers with absolute and relative tolerances
Author :
V. Kolarik;S. Mir;M. Lubaszewski;B. Courtois
Author_Institution :
TIMA/INPG Lab., Grenoble, France
Abstract :
The design of checkers aimed at the concurrent test of analog and mixed-signal circuits is considered in this paper. These checkers can on-line test duplicated and fully differential analog circuits. The test approach is based on exploiting the inherent redundancy of these circuits which results in the use of a code for the analog signals. The analog code is monitored by the checkers. An error signal which complies with existing digital self-checking parts is generated in the case that a code fails out of the valid code space. For the verification of the analog codes, absolute tolerance margins and tolerance margins which are made relative to signal amplitude are considered. A test pattern generator for off-line testing of the checkers is proposed.
Keywords :
"Circuit testing","Analog circuits","Laboratories","Redundancy","Safety","Circuit faults","Automatic testing","System testing","Monitoring","Signal generators"
Journal_Title :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems