3797102

VLSI - Designer´s Interface

Donald Bouldin

22

5

2006

3

6

"Very large scale integration","Random access memory","Single event upset","Application specific integrated circuits","Logic arrays","Field programmable gate arrays","Radiation hardening","Magnetoresistance","Buffer storage","Fault tolerance"

IEEE Circuits and Devices Magazine

ieee

8755-3996

jour

10.1109/MCD.2006.272995

4049876