Title :
Global responsibilities in SoC design
Author_Institution :
Virtual Silicon Technology, US
Keywords :
Automatic testing; Computer architecture; Costs; Design automation; Educational programs; Electronics industry; Europe; Power generation economics; Silicon; Software systems;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998240