Internet-based collaborative test generation with MOSCITO

Author

Schneider, A. ; Ivask, E. ; Miklos, P. ; Raik, J. ; Diener, K.H. ; Ubar, R. ; Cibakova, T. ; Gramatová, E.

Author_Institution

Fraunhofer Inst. for Integrated Circuits, Germany

fYear

2002

fDate

2002

Firstpage

221

Lastpage

226

Abstract

This paper offers an Internet-based environment for enhancing problem-specific design flows with test pattern generation and fault simulation capabilities. Automatic Test Pattern Generation (ATPG) and fault simulation tools at structural and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented. These tools can be used separately, or in multiple applications, for test pattern generation of digital circuits. In order to link different tools together and with commercial design systems, respectively a set of translators was developed. The functionality of the integrated design and test system was verified by several benchmark circuits

Keywords

Internet; automatic test pattern generation; fault simulation; groupware; Internet; MOSCITO system; automatic test pattern generation; collaborative test generation; digital circuit; fault simulation; translator; virtual environment; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Collaboration; Digital circuits; Internet; System testing; Test pattern generators; Virtual environment;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings

Conference_Location

Paris

ISSN

1530-1591

Print_ISBN

0-7695-1471-5

Type

conf

DOI

10.1109/DATE.2002.998273

Filename

998273