• DocumentCode
    379747
  • Title

    Effective software self-test methodology for processor cores

  • Author

    Kranitis, N. ; Paschalis, A. ; Gizopoulos, D. ; Zorian, Y.

  • Author_Institution
    Dept. of Informatics & Telecommun., Athens Univ., Greece
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    592
  • Lastpage
    597
  • Abstract
    Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning technique for sharing the testing task of complex systems-on-chip (SoC) between slow, inexpensive testers and embedded code stored in memory cores of the SoC. We introduce an efficient methodology for processor cores self-testing which requires knowledge of their instruction set and Register Transfer (RI) level description. Compared with functional testing methodologies proposed in the past, our methodology is more efficient in terms of fault coverage, test code size and test application time. Compared with recent software based structural testing methodologies for processor cores, our methodology is superior in terms of test development effort and has significantly smaller code size and memory requirements, while virtually the same fault coverage is achieved with an order of magnitude smaller test application time
  • Keywords
    application specific integrated circuits; built-in self test; fault diagnosis; high level synthesis; instruction sets; logic partitioning; logic testing; microprocessor chips; SoC; fault coverage; instruction set; processor cores; register transfer level description; software self-test methodology; test application time; test code size; test development effort; test resource partitioning technique; Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Informatics; Logic testing; Software testing; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998361
  • Filename
    998361