DocumentCode :
379747
Title :
Effective software self-test methodology for processor cores
Author :
Kranitis, N. ; Paschalis, A. ; Gizopoulos, D. ; Zorian, Y.
Author_Institution :
Dept. of Informatics & Telecommun., Athens Univ., Greece
fYear :
2002
fDate :
2002
Firstpage :
592
Lastpage :
597
Abstract :
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning technique for sharing the testing task of complex systems-on-chip (SoC) between slow, inexpensive testers and embedded code stored in memory cores of the SoC. We introduce an efficient methodology for processor cores self-testing which requires knowledge of their instruction set and Register Transfer (RI) level description. Compared with functional testing methodologies proposed in the past, our methodology is more efficient in terms of fault coverage, test code size and test application time. Compared with recent software based structural testing methodologies for processor cores, our methodology is superior in terms of test development effort and has significantly smaller code size and memory requirements, while virtually the same fault coverage is achieved with an order of magnitude smaller test application time
Keywords :
application specific integrated circuits; built-in self test; fault diagnosis; high level synthesis; instruction sets; logic partitioning; logic testing; microprocessor chips; SoC; fault coverage; instruction set; processor cores; register transfer level description; software self-test methodology; test application time; test code size; test development effort; test resource partitioning technique; Application software; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Informatics; Logic testing; Software testing; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
ISSN :
1530-1591
Print_ISBN :
0-7695-1471-5
Type :
conf
DOI :
10.1109/DATE.2002.998361
Filename :
998361
Link To Document :
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