DocumentCode
379750
Title
Layout driven decomposition with congestion consideration
Author
Kutzschebauch, Thomas ; Stok, Leon
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2002
fDate
2002
Firstpage
672
Lastpage
676
Abstract
We present a novel algorithm that applies physical layout information during common subexpression extraction to improve wiring congestion and delay, resulting in improved design closure. As feature sizes decrease and chip sizes increase, the traditional separation of physical design and logic synthesis proves to be increasingly detrimental. Interconnect delay and wiring congestion, among the most critical objective functions to meet design closure, are not considered during logic synthesis. On the other hand, physical design is too deep in the design process to be able to significantly restructure the already technology mapped netlist. While this problem has been addressed previously, the existing solutions only apply simple synthesis transforms during physical design. Hence they are generally unable to reverse decisions made during logic restructuring which have a major negative impact on the circuit structure. In our novel approach, we propose a layout driven algorithm for the concurrent extraction of common subexpressions, one of the most important steps that affect the overall circuit structure, and consequently congestion and wire length during logic synthesis. In addition, we consider dependency relations between cube divisors to improve the extraction process. As a result, our layout driven decomposition algorithm combines logic synthesis and physical layout information to effectively decrease wire length and improve congestion for improved design closure
Keywords
VLSI; circuit layout CAD; circuit optimisation; delay estimation; integrated circuit interconnections; logic CAD; algorithm; delay; feature sizes; interconnect delay; layout driven algorithm; layout driven decomposition; logic restructuring; logic synthesis; physical layout; subexpression extraction; wiring congestion; Algorithm design and analysis; Circuit synthesis; Data mining; Delay; Integrated circuit interconnections; Logic circuits; Logic design; Process design; Wire; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location
Paris
ISSN
1530-1591
Print_ISBN
0-7695-1471-5
Type
conf
DOI
10.1109/DATE.2002.998371
Filename
998371
Link To Document