• DocumentCode
    379752
  • Title

    An interconnect-aware methodology for analog and mixed signal design, based on high bandwidth (over 40 GHz) on-chip transmission line approach

  • Author

    Goren, David ; Zelikson, Michael ; Galambos, Tiberiu C. ; Gordin, Rachel ; Livshitz, Betty ; Amir, Alon ; Sherman, Anatoly ; Wagner, Israel A.

  • Author_Institution
    IBM Haifa Res. & Dev. Labs., Israel
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    804
  • Lastpage
    811
  • Abstract
    This paper presents an on-chip, interconnect-aware methodology for high-speed analog and mixed signal (AMS) design which enables early incorporation of on-chip transmission line (T-line) components into AMS design flow. The proposed solution is based on a set of parameterized T-line structures, which include single and two coupled microstrip lines with optional side shielding, accompanied by compact true transient models. The models account for frequency dependent skin and proximity effects, while maintaining passivity requirements due to their pure RLC nature. The signal bandwidth supported by the models covers a range from DC to 100 GHz. The models are currently verified in terms of S-parameter data against hardware (up to 40 GHz) and against EM solver (up to 100 GHz). This methodology has already been used for several designs implemented in SiGe (silicon-germanium) BiCMOS technology.
  • Keywords
    BiCMOS integrated circuits; S-parameters; analogue integrated circuits; coupled transmission lines; electromagnetic shielding; integrated circuit interconnections; integrated circuit layout; microstrip lines; mixed analogue-digital integrated circuits; skin effect; transient response; transmission line theory; 0 to 100 GHz; 100 GHz; 40 GHz; EM solver; RLC passivity; SiGe; SiGe BiCMOS technology; T-line components; analog-mixed signal design; coupled microstrip lines; frequency dependent skin effects; hardware S-parameter data; high bandwidth on-chip transmission line approach; high-speed AMS design flow; interconnect-aware design methodology; parameterized T-line structures; proximity effects; side shielding; signal bandwidth range; single microstrip lines; transient models; Bandwidth; Couplings; Frequency dependence; Germanium silicon alloys; Microstrip; Power system transients; Signal design; Silicon germanium; Skin; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1471-5
  • Type

    conf

  • DOI
    10.1109/DATE.2002.998391
  • Filename
    998391