DocumentCode
379758
Title
Minimal test for coupling faults in word-oriented memories
Author
van de Goor, A.J. ; Abadir, Magdy S. ; Carlin, Alan
Author_Institution
Dept. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
fYear
2002
fDate
2002
Firstpage
944
Lastpage
948
Abstract
Most industrial memories have an external word-width of more than one bit. However, most published memory test algorithms assume 1-bit memories; they will not detect coupling faults between the cells of a word. This paper improves upon the state of the art in testing word-oriented memories by presenting a new method for detecting state coupling faults between cells of the same word, based on the use of m-out-of-n codes. The result is a reduction in test time, which varies between 26 and 38%
Keywords
automatic testing; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; data backgrounds; m-out-of-n codes; memory test algorithms; minimal test; state coupling faults; test time; word-oriented memories; Boolean functions; Chromium; Data structures; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location
Paris
ISSN
1530-1591
Print_ISBN
0-7695-1471-5
Type
conf
DOI
10.1109/DATE.2002.998413
Filename
998413
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