Title :
Minimal test for coupling faults in word-oriented memories
Author :
van de Goor, A.J. ; Abadir, Magdy S. ; Carlin, Alan
Author_Institution :
Dept. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
Abstract :
Most industrial memories have an external word-width of more than one bit. However, most published memory test algorithms assume 1-bit memories; they will not detect coupling faults between the cells of a word. This paper improves upon the state of the art in testing word-oriented memories by presenting a new method for detecting state coupling faults between cells of the same word, based on the use of m-out-of-n codes. The result is a reduction in test time, which varies between 26 and 38%
Keywords :
automatic testing; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; data backgrounds; m-out-of-n codes; memory test algorithms; minimal test; state coupling faults; test time; word-oriented memories; Boolean functions; Chromium; Data structures; Testing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998413
