Title :
Macromodeling of digital I/O ports for system EMC assessment
Author :
Stievano, I.S. ; Chen, Z. ; Becker, D. ; Canavero, F.G. ; Katopis, G. ; Maio, I.A.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Abstract :
This paper addresses the development of accurate and efficient behavioral models of digital integrated circuit input and output ports for EMC and signal integrity simulations. A practical modeling process is proposed and applied to some example devices. The modeling process is simple and efficient, and it yields models performing at a very high accuracy level
Keywords :
digital integrated circuits; electromagnetic compatibility; integrated circuit modelling; integrated circuit reliability; EMC simulations; behavioral models; digital I/O ports; digital integrated circuit input ports; digital integrated circuit output ports; macromodeling; model accuracy; modeling process; signal integrity simulations; system EMC assessment; Circuit simulation; Digital integrated circuits; Driver circuits; Electromagnetic compatibility; Electronic switching systems; Equations; Integrated circuit modeling; Parametric statistics; State estimation; Voltage;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998429
