DocumentCode
379778
Title
Fault detection and diagnosis using wavelet based transient current analysis
Author
Bhunia, Swarup ; Roy, Kaushik
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2002
fDate
2002
Firstpage
1118
Abstract
We present a novel integrated method for fault detection and localization using wavelet transform of transient current (IDD) waveform. The time-frequency resolution property of wavelet helps us detect as well as localize faults in digital CMOS circuits. Experiments performed on an 8-bit ALU show promising results for both detection and localization
Keywords
CMOS digital integrated circuits; delays; fault location; integrated circuit testing; transients; wavelet transforms; 8-bit ALU; IDD waveform; digital CM´OS circuits; fault location; time-frequency resolution; transient current; wavelet; wavelet transform; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Frequency; Signal resolution; Transient analysis; Wavelet analysis; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location
Paris
ISSN
1530-1591
Print_ISBN
0-7695-1471-5
Type
conf
DOI
10.1109/DATE.2002.998474
Filename
998474
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