DocumentCode :
3798529
Title :
Fault Modeling
Volume :
2
Issue :
2
fYear :
1985
Firstpage :
88
Lastpage :
95
Keywords :
"Tutorials","Semiconductor device modeling","Circuit testing","CMOS technology","MOSFETs","Integrated circuit interconnections","Substrates","Computer aided manufacturing","Digital systems","Logic testing"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294873
Filename :
4069555
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798529
