DocumentCode :
3798537
Title :
D&T Interview
Volume :
2
Issue :
3
fYear :
1985
Firstpage :
73
Lastpage :
80
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294743
Filename :
4069591
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798537
