DocumentCode :
3798550
Title :
Design And Test in Japan Akihiko Yamada, NEC Corporation
Volume :
2
Issue :
5
fYear :
1985
Firstpage :
15
Lastpage :
16
Keywords :
"National electric code","Circuit testing","Very large scale integration","Logic design","System testing","Design automation","Laboratories","Circuit simulation","Computer aided manufacturing","Large scale integration"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294811
Filename :
4069655
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798550
