• DocumentCode
    3798550
  • Title

    Design And Test in Japan Akihiko Yamada, NEC Corporation

  • Volume
    2
  • Issue
    5
  • fYear
    1985
  • Firstpage
    15
  • Lastpage
    16
  • Keywords
    "National electric code","Circuit testing","Very large scale integration","Logic design","System testing","Design automation","Laboratories","Circuit simulation","Computer aided manufacturing","Large scale integration"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1985.294811
  • Filename
    4069655
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3798550