• DocumentCode
    3798564
  • Title

    Sampling Quality

  • Volume
    3
  • Issue
    1
  • fYear
    1986
  • Firstpage
    10
  • Lastpage
    11
  • Keywords
    "Sampling methods","Very large scale integration","Educational institutions","Routing","Design for testability","System testing","Design automation","Automatic testing","Silicon compiler","Computer aided manufacturing"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1986.294912
  • Filename
    4069723
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3798564