DocumentCode :
3798587
Title :
The Future of Test
Volume :
3
Issue :
4
fYear :
1986
Firstpage :
13
Lastpage :
14
Keywords :
"Circuit testing","System testing","Fixtures","Costs","Semiconductor device testing","Random access memory","Very large scale integration","Electrons","Paper technology","Artificial intelligence"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1986.294963
Filename :
4069821
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798587
