DocumentCode
3798587
Title
The Future of Test
Volume
3
Issue
4
fYear
1986
Firstpage
13
Lastpage
14
Keywords
"Circuit testing","System testing","Fixtures","Costs","Semiconductor device testing","Random access memory","Very large scale integration","Electrons","Paper technology","Artificial intelligence"
Journal_Title
IEEE Design & Test of Computers
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1986.294963
Filename
4069821
Link To Document