DocumentCode :
3798623
Title :
Expert System Offers Artificially Intelligent Guidance to Built-In Self-Testing of CMOS Stuck-Open Faults in Hardware Accelerators Built with Systolic Arrays Produced by Silicon Compilers via Simulated Annealing
Volume :
4
Issue :
2
fYear :
1987
Firstpage :
6
Lastpage :
7
Keywords :
"Expert systems","Intelligent systems","Artificial intelligence","Built-in self-test","Hardware","Systolic arrays","Silicon compiler","Read only memory","Simulated annealing","Circuit faults"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1987.295097
Filename :
4069955
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3798623