DocumentCode :
3799722
Title :
MicroReview
Author :
David L. Hannum
Author_Institution :
AT&T Information Systems
Volume :
6
Issue :
3
fYear :
1986
Firstpage :
84
Lastpage :
85
Keywords :
Book reviews
Journal_Title :
IEEE Micro
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/MM.1986.304688
Filename :
4089657
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3799722
