• DocumentCode
    3800110
  • Title

    VLSI Designer´s Interface

  • Author

    Donald Bouldin

  • Volume
    22
  • Issue
    6
  • fYear
    2006
  • Firstpage
    3
  • Lastpage
    5
  • Keywords
    "Very large scale integration","Design for testability","Logic testing","Educational institutions","Automatic testing","Digital signal processing","Sun","Licenses","Hardware","Books"
  • Journal_Title
    IEEE Circuits and Devices Magazine
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/MCD.2006.307269
  • Filename
    4099507