DocumentCode :
3800110
Title :
VLSI Designer´s Interface
Author :
Donald Bouldin
Volume :
22
Issue :
6
fYear :
2006
Firstpage :
3
Lastpage :
5
Keywords :
"Very large scale integration","Design for testability","Logic testing","Educational institutions","Automatic testing","Digital signal processing","Sun","Licenses","Hardware","Books"
Journal_Title :
IEEE Circuits and Devices Magazine
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2006.307269
Filename :
4099507
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3800110
