DocumentCode :
380019
Title :
Comparative characteristics studies on on-chip single- and double-level square inductors
Author :
Yin, W.Y. ; Gan, Y.B. ; Pan, S.J. ; Li, L.W. ; Wu, B. ; Ooi, O.B. ; Kooi, P.S.
Author_Institution :
Temasek Labs., Nat. Univ. of Singapore, Singapore
Volume :
1
fYear :
2002
fDate :
2002
Firstpage :
352
Abstract :
Detailed experimental investigations are carried out in this paper to show the inductance, Q-factor as well as resonant frequency of on-chip square single- and double-level inductors on silicon substrates. Based on the equivalent circuit model developed and the S-parameters measured using a de-embedding technique, inductances, Q-factors and resonant frequencies of these inductors are determined and compared with one another. Parametric studies are carried out to show the effects of both strip length and inner empty area on the coupling capacitance and resonant frequency of these inductors, and some scalable formulas are derived for extrapolating inductance and resonant frequency of other inductors. It is demonstrated that in the double-level cases very strong self-inductor resonance can take place with lower resonant frequency, and Q-factor is degraded rapidly.
Keywords :
Q-factor measurement; S-parameters; capacitance measurement; equivalent circuits; inductance measurement; inductors; resonance; silicon; substrates; Q-factor; S-parameter measurement; coupling capacitance; de-embedding technique; double-level square inductors; equivalent circuit model; inductance; inner empty area; on-chip single-level square inductors; resonant frequency; scalable formulas; self-inductor resonance; silicon substrates; strip length; Equivalent circuits; Frequency measurement; Inductance; Inductors; Parametric study; Q factor; Resonant frequency; Scattering parameters; Silicon; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2002. IEEE
Print_ISBN :
0-7803-7330-8
Type :
conf
DOI :
10.1109/APS.2002.1016320
Filename :
1016320
Link To Document :
بازگشت