Full-wave analysis of multi-level couplings between planar sources. Influence of interrupted, backed and grilled ground shields

This paper presents a full wave analysis of the coupling between planar sources, with arbitrary positions, in standard multi-level silicon ICs. To validate the concept of planar sources, an application to the excitation of a wide band E shaped antenna is considered and the obtained simulation results are successfully compared to measurements and published results. The influence of backed, interrupted and grilled ground planes on the isolation performance in a multilayer lossy silicon substrate is investigated. An interrupted ground shield introduced to screen the silicon substrate parasitic effects is seen to reduce the coupling about 5 to 15 dB at high frequencies.