Surface impedance of thin high temperature superconducting films with a sapphire dielectric resonator

Author

Krupka, J. ; Derzakowski, K. ; Abramowicz, A. ; Baker-Jarvis, J. ; Ono, R. ; Geyer, R.

Author_Institution

Inst. of Microelectron. & Optoelectron., Warsaw, Poland

Volume

2

fYear

2002

fDate

2002

Firstpage

391

Abstract

The dielectric resonator technique is frequently used for surface resistance measurements of superconducting films. Generally, an effective surface resistance has been measured which neglects the finite thickness of superconducting films. The thickness dependence of the surface impedance of superconducting films, whose thickness is comparable to the London penetration depth, is presented.

Keywords

Q-factor; dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; penetration depth (superconductivity); sapphire; superconducting thin films; surface resistance; Al₂O₃; London penetration depth thickness; Q-factor; dielectric resonator surface resistance measurement techniques; effective surface resistance; high-temperature superconducting thin films; resonant frequency; sapphire dielectric resonators; superconducting film finite thickness; surface impedance measurements; surface impedance thickness dependence; Dielectric measurements; Electrical resistance measurement; Frequency measurement; Impedance measurement; Q factor; Resonant frequency; Superconducting films; Surface impedance; Surface resistance; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on

Print_ISBN

83-906662-5-1

Type

conf

DOI

10.1109/MIKON.2002.1017873

Filename

1017873