• DocumentCode
    380236
  • Title

    Bounds on permittivity calculations using the TE01δ dielectric resonator

  • Author

    Krupka, J. ; Derzakowski, K. ; Abramowicz, A. ; Riddle, B. ; Baker-Jarvis, J. ; Clarke, R.N. ; Rochard, O.C.

  • Author_Institution
    Inst. of Microelectron. & Optoelectron., Warsaw, Poland
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    394
  • Abstract
    The use of both mode-matching and Rayleigh-Ritz numerical techniques for complex permittivity calculations using a TE01δ mode dielectric resonator allows the determination of lower and upper bounds of the permittivity. The maximum difference of the relative permittivity obtained from the two techniques does not exceed 0.125% for a cavity-to-sample volume ratio from 1 to 64 and relative permittivity values in the range of 1 to 100. These results were obtained by employing 126 basis functions with the Rayleigh-Ritz technique and 10 basis functions with the mode-matching method. It is possible to increase the computational accuracy of the calculations by increasing the number of basis functions.
  • Keywords
    Rayleigh-Ritz methods; dielectric loss measurement; dielectric resonators; measurement uncertainty; microwave measurement; mode matching; permittivity measurement; Rayleigh-Ritz numerical techniques; TE01δ dielectric resonator permittivity measurements; basis functions; calculation computational accuracy; cavity-to-sample volume ratio; dielectric loss tangent; low-loss dielectric materials; measurement uncertainty; microwave frequency complex permittivity measurement; mode-matching numerical techniques; permittivity lower/upper bounds; permittivity measurement calculation bounds; relative permittivity; Dielectric losses; Electromagnetic fields; Measurement uncertainty; Mode matching methods; Permittivity measurement; Resonance; Resonant frequency; Tellurium; Testing; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
  • Print_ISBN
    83-906662-5-1
  • Type

    conf

  • DOI
    10.1109/MIKON.2002.1017874
  • Filename
    1017874