DocumentCode
3803021
Title
Design Considerations for Paralleling Bipolar Transistors
Author
Milan M. Jovanovic;Fred C. Y. Lee
Volume
2
Issue
4
fYear
1987
Firstpage
328
Lastpage
336
Abstract
A simple design procedure for direct paralleling of bipolar junction transistors (BJT´s) is proposed. It is based on the matching of transfer characteristics (Ic versus VCE) at a low collector voltage. The design procedure further addresses the base and collector circuit´s layout requirements, optimal base-driven conditions, and thermal design requirements for reliable and efficient operation of BJT´s in parallel. The influence of a snubber circuit is also discussed. The procedure is verified experimentally by performing dynamic and reversebias safe operating area (RBSOA) testings.
Keywords
"Bipolar transistors","Switches","Snubbers","Circuit testing","Performance evaluation","Thermal factors","Low voltage","Electronic packaging thermal management","Redundancy","Costs"
Journal_Title
IEEE Transactions on Power Electronics
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.1987.4307868
Filename
4307868
Link To Document