• DocumentCode
    380544
  • Title

    Investigation of the predictability of neural cell survival after exposure to non-uniform electric fields

  • Author

    Heida, T. ; Rutten, W.L.C. ; Marani, E.

  • Author_Institution
    Fac. of Electr. Eng., Twente Univ., Enschede, Netherlands
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    753
  • Abstract
    Cortical rat neurons were trapped by negative dielectrophoresis (DEP) using a planar quadrupole electrode structure. The non-uniform field created by this structure was calculated using a finite element software package. By representing the neuron by a single-shell model the membrane potential induced by the electric field can be estimated. It was investigated whether the physiological state of the trapped neurons can be predicted using this estimation. Experimentally, the physiological state of cortical cells trapped at different amplitudes and frequencies of the input signal was determined using a staining method. The conclusion is that a rough estimate of the minimum frequency and maximum amplitude can be given in order to predict the status of viability of the cells after being dielectrophoretically trapped.
  • Keywords
    bioelectric potentials; biological effects of fields; biological techniques; biomembrane transport; electrophoresis; finite element analysis; neurophysiology; cortical rat neuron; electroporation; finite element analysis; maximum amplitude; membrane breakdown; membrane potential; minimum frequency; negative dielectrophoresis; neural cell survival predictability; nonuniform electric field exposure; physiological state; planar microelectrode plate; single-shell model; staining method; trapped neurons; viability status; Amplitude estimation; Biomembranes; Dielectrophoresis; Electrodes; Finite element methods; Frequency estimation; Neurons; Nonuniform electric fields; Software packages; State estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2001. Proceedings of the 23rd Annual International Conference of the IEEE
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-7211-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2001.1019050
  • Filename
    1019050