DocumentCode

3806547

Title

Errata

Volume

29

Issue

2

fYear

1982

Firstpage

1058

Lastpage

1058

Keywords

"MOS devices","Large scale integration","Testing"

Journal_Title

IEEE Transactions on Nuclear Science

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1982.4336314

Filename

4336314