DocumentCode :
3806547
Title :
Errata
Volume :
29
Issue :
2
fYear :
1982
Firstpage :
1058
Lastpage :
1058
Keywords :
"MOS devices","Large scale integration","Testing"
Journal_Title :
IEEE Transactions on Nuclear Science
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1982.4336314
Filename :
4336314
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3806547
