مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3807779

Title :

Discussion

Volume :

Issue :

fYear :

1958

Firstpage :

764

Lastpage :

765

Keywords :

"Moisture","Circuit faults","Resistance","Construction industry","Reliability","Integrated circuit reliability","Companies","indium","arsenic","nitrogen","operations research","beryllium","astatine","paper"

Journal_Title :

Transactions of the American Institute of Electrical Engineers. Part III: Power Apparatus and Systems

Publisher :

ieee

ISSN :

0097-2460

Type :

jour

DOI :

10.1109/AIEEPAS.1958.4500022

Filename :

4500022

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3807779