مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3808656

Title :

Discussion

Issue :

fYear :

1979

Firstpage :

569

Lastpage :

569

Keywords :

"Switches","Monitoring","Switching circuits","Delay","Electrical engineering","Economics","Integrated circuit reliability","arsenic","indium","beryllium","engineering","operations research"

Journal_Title :

IEEE Transactions on Industry Applications

Publisher :

ieee

ISSN :

0093-9994

Type :

jour

DOI :

10.1109/TIA.1979.4503706

Filename :

4503706

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3808656