DocumentCode

3808806

Title

Discussion of ``Relationship of X/R, Ip and I´rms to Asymmetry in Resistance/Reactance Circuits´´

Issue

5

fYear

1986

Firstpage

964

Lastpage

964

Keywords

"Circuit faults","Thermal stresses","Linear systems","Heating","Reactive power"

Journal_Title

IEEE Transactions on Industry Applications

Publisher

ieee

ISSN

0093-9994

Type

jour

DOI

10.1109/TIA.1986.4504820

Filename

4504820