DocumentCode :
3810460
Title :
Signal Integrity Enhancement in Digital Circuits
Author :
Jorge Filipe L.C. Semio;Marcial Jesus Rodriguez Irago;Juan J. Rodriguez-Andina;Leonardo Bisch Piccoli;Fabian Luis Vargas;Marcelino Bicho dos Santos;Isabel Maria Cacho Teixeira;Joao Paulo Teixeira
Author_Institution :
University of Algarve
Volume :
25
Issue :
5
fYear :
2008
Firstpage :
452
Lastpage :
461
Abstract :
This article proposes a new methodology for enhancing SoC signal integrity without degrading performance in the presence of power-ground voltage transients. The underlying principle is the dynamic adaptation of the clock duty cycle to propagation delay variation along disturbed logic paths. This methodology makes digital circuits more robust to power line fluctuations while maintaining the at-speed clock rate.
Keywords :
"Digital circuits","Clocks","RLC circuits","Power supplies","Voltage","Propagation delay","Power grids","Circuit testing","Frequency","Signal generators"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.146
Filename :
4648427
Link To Document :
بازگشت