Title :
Compositions and Magnetic Properties of CoO/Co/Ge(111) Films
Author :
Jyh-Shen Tsay ; Po-Ching Chuang ; Chang, Cheng-Hsun-Tony ; Yeong-Der Yao
Author_Institution :
Dept. of Phys., Nat. Taiwan Normal Univ., Taipei, Taiwan
Abstract :
On the top of Co/Ge(111) films, cobalt oxides are prepared by evaporating Co atoms in an oxygen atmosphere. Depth profiling measurements show a layered structure of a pure Co layer covered by a CoO overlayer. As the CoO thickness increases, the Auger intensity ratio of O KL2L2 and Co L3M45M45 Auger signals increases until reaching a saturated value which shows a CoO layer with a concentration ratio of Co and O close to 1:1. After introduction of CoO overlayers on Co/Ge(111), hysteresis occurs in the longitudinal configuration and CoO/Co/Ge(111) exhibits in-plane anisotropy. A slight reduction of the Kerr intensity occurs due to the oxidation of cobalt at the CoO/Co interface while an enhanced coercive force is observed owing to the imperfection introduced by oxygen to impede the magnetization reversal. Under conditions of cooling in a magnetic field, exchange bias field increases as the sample temperature decreases resulting from the formation of an antiferromagnetic/ferromagnetic interface.
Keywords :
Auger effect; Kerr magneto-optical effect; antiferromagnetic materials; cobalt; cobalt compounds; coercive force; exchange interactions (electron); ferromagnetic materials; germanium; magnetic anisotropy; magnetic cooling; magnetic hysteresis; magnetic multilayers; magnetic thin films; magnetisation reversal; oxidation; Auger intensity ratio; CoO-Co-Ge; CoO/Co/Ge(111) films; Kerr intensity; antiferromagnetic/ferromagnetic interface; cobalt oxides; coercive force; compositions; cooling; depth profiling; exchange bias field; hysteresis; in-plane anisotropy; layered structure; longitudinal configuration; magnetic field; magnetic properties; magnetization reversal; oxidation; oxygen atmosphere; Cobalt; Coercive force; Magnetic hysteresis; Perpendicular magnetic anisotropy; Sputtering; Temperature measurement; Bilayer; composition; exchange bias; oxide; ultrathin films;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2013.2275992