DocumentCode
3812588
Title
Erratum: Contactless nondestructive technique for the measurement of minority-carrier lifetime and diffusion length in silicon
Author
J.C. White;T.F. Unter;J.G. Smith
Volume
1
Issue
6
fYear
1977
fDate
11/1/1977 12:00:00 AM
Firstpage
192
Journal_Title
IEE Journal on Solid-State and Electron Devices
Publisher
iet
ISSN
0308-6968
Type
jour
DOI
10.1049/ij-ssed:19770030
Filename
4807545
Link To Document