Title :
Generic Failure-Risk Assessment of Industrial Processes due to Voltage Sags
Author :
Jhan Yhee Chan;Jovica V. Milanovic;Alice Delahunty
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
Abstract :
This paper proposes methodologies for modeling and assessment of equipment and industrial processes susceptibility to voltage sags and short interruptions. Voltage sag severity indices are proposed that translate physical disturbance events into expected equipment behavior, allowing fast identification of possible process failure. Based on these indices, probabilistic and fuzzy-based methodologies are developed to provide realistic equipment representation and to incorporate flexibility for customized process modeling. Extensive simulations showed that the proposed models and methodologies yield greater accuracy in assessments compared to conventional approaches.
Keywords :
"Power quality","Voltage fluctuations","Variable speed drives","Programmable control","High intensity discharge lamps","Power engineering and energy","Testing","Investments","Contracts","Information technology"
Journal_Title :
IEEE Transactions on Power Delivery
DOI :
10.1109/TPWRD.2009.2014493