DocumentCode :
3816305
Title :
D&T Interview
Volume :
1
Issue :
2
fYear :
1984
Firstpage :
110
Lastpage :
115
Keywords :
"Interviews","Logic design","Automatic testing","Semiconductor device testing","Logic testing","Circuit testing","Design methodology","Computer aided manufacturing","Nonhomogeneous media"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1984.5005622
Filename :
5005622
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3816305
