DocumentCode :
3816313
Title :
Probing the State of the Art
Author :
Richard M. Sedmak;Donald E. Thomas
Author_Institution :
BITE, Inc
Volume :
1
Issue :
3
fYear :
1984
Keywords :
"Circuit testing","System testing","Automatic testing","Design automation","Timing","Engineering management","Integrated circuit testing","Application specific integrated circuits","High speed integrated circuits","Transmission line theory"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1984.5005645
Filename :
5005645
Link To Document :
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