DocumentCode :
3816323
Title :
D&T Interview
Volume :
1
Issue :
4
fYear :
1984
Firstpage :
15
Lastpage :
23
Keywords :
"Interviews","Microprocessors","Industrial control","Lead compounds","MOS devices","Microcontrollers","Integrated circuit packaging","Read only memory","Read-write memory"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1984.5005683
Filename :
5005683
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3816323
