The StarLight metrology subsystem

Author

Dubovitsky, Serge ; Lay, Oliver P. ; Abramovici, Alexander ; Hawley, James G. ; Kuhnert, Andreas C. ; Mulder, Jerry L. ; Asbury, Cheryl G.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

4

fYear

2002

fDate

2002

Abstract

We describe a metrology subsystem for NASA´s StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the metrology subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.

Keywords

aerospace instrumentation; artificial satellites; astronomical instruments; displacement measurement; extrasolar planets; light interferometers; measurement by laser beam; phase modulation; NASA StarLight mission; StarLight metrology subsystem; angular metrology; carrier phase modulation; displacement sensing; dual-target linear metrology; flight qualifiable subsystem components; heterodyne interferometer; laser beam pointing; separated-spacecraft stellar interferometer; space-based stellar interferometer; stellar interferometer testbed; Delay lines; Extraterrestrial measurements; Frequency measurement; Length measurement; Metrology; Optical interferometry; Optical mixing; Optical sensors; Space technology; Space vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace Conference Proceedings, 2002. IEEE

Print_ISBN

0-7803-7231-X

Type

conf

DOI

10.1109/AERO.2002.1036886

Filename

1036886