DocumentCode
381707
Title
Temporal noise in CMOS passive pixels
Author
Fujimori, Lliana L. ; Sodini, Charles G.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume
1
fYear
2002
fDate
2002
Firstpage
140
Abstract
The temporal noise in a CMOS passive pixel imager is directly proportional to the vertical resolution of the imager and indirectly proportional to the pixel area, resulting in a strong dependence between noise and pixel density. In this paper, we model the output circuit read noise and capacitance reset noise and its effect on the output of the imager. Measured results validate the model and demonstrate that there is a tradeoff between pixel density, power and noise.
Keywords
CMOS image sensors; capacitance; circuit feedback; integrated circuit modelling; integrated circuit noise; readout electronics; CMOS passive pixel imager; capacitance reset noise; column line capacitance; dominant pole capacitance; feedback capacitance; high-density imagers; noise folding; noise model; output circuit read noise; pixel area; pixel density; temporal noise; vertical resolution; CMOS image sensors; CMOS technology; Capacitance; Circuit noise; Computer science; Image resolution; Noise measurement; Pixel; Semiconductor device modeling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2002. Proceedings of IEEE
Print_ISBN
0-7803-7454-1
Type
conf
DOI
10.1109/ICSENS.2002.1037005
Filename
1037005
Link To Document