Title :
Temporal noise in CMOS passive pixels
Author :
Fujimori, Lliana L. ; Sodini, Charles G.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
The temporal noise in a CMOS passive pixel imager is directly proportional to the vertical resolution of the imager and indirectly proportional to the pixel area, resulting in a strong dependence between noise and pixel density. In this paper, we model the output circuit read noise and capacitance reset noise and its effect on the output of the imager. Measured results validate the model and demonstrate that there is a tradeoff between pixel density, power and noise.
Keywords :
CMOS image sensors; capacitance; circuit feedback; integrated circuit modelling; integrated circuit noise; readout electronics; CMOS passive pixel imager; capacitance reset noise; column line capacitance; dominant pole capacitance; feedback capacitance; high-density imagers; noise folding; noise model; output circuit read noise; pixel area; pixel density; temporal noise; vertical resolution; CMOS image sensors; CMOS technology; Capacitance; Circuit noise; Computer science; Image resolution; Noise measurement; Pixel; Semiconductor device modeling; Voltage;
Conference_Titel :
Sensors, 2002. Proceedings of IEEE
Print_ISBN :
0-7803-7454-1
DOI :
10.1109/ICSENS.2002.1037005
