• DocumentCode
    3817234
  • Title

    Discussion

  • Author

    F. A. Byles

  • Volume
    48
  • Issue
    3
  • fYear
    1929
  • Firstpage
    811
  • Lastpage
    811
  • Keywords
    "Regulators","Circuit testing","Tungsten","Life testing","Time measurement","Frequency","Laboratories","Voltage measurement","Transformer cores","Resistors"
  • Journal_Title
    Transactions of the American Institute of Electrical Engineers
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1929.5055296
  • Filename
    5055296