• DocumentCode
    3817241
  • Title

    Discussion

  • Author

    R. L. McCoy

  • Volume
    48
  • Issue
    3
  • fYear
    1929
  • Firstpage
    893
  • Lastpage
    895
  • Keywords
    "Fuses","Circuit testing","Flashover","Assembly","System testing","Surges","Insulation","Materials testing","Conductivity","Conducting materials"
  • Journal_Title
    Transactions of the American Institute of Electrical Engineers
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1929.5055312
  • Filename
    5055312
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3817241