DocumentCode :
3817621
Title :
Discussion
Author :
J. E. Clem
Volume :
52
Issue :
2
fYear :
1933
Firstpage :
519
Lastpage :
520
Keywords :
"Conductors","Frequency","Skin effect","Testing","Copper","Wire","Qualifications","Inspection","Magnetic flux","Identity-based encryption"
Journal_Title :
Transactions of the American Institute of Electrical Engineers
Publisher :
ieee
ISSN :
0096-3860
Type :
jour
DOI :
10.1109/T-AIEE.1933.5056343
Filename :
5056343
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3817621
