• DocumentCode
    3817623
  • Title

    Discussion

  • Author

    P. L. Bellaschi

  • Volume
    52
  • Issue
    2
  • fYear
    1933
  • Firstpage
    553
  • Lastpage
    567
  • Keywords
    "Surges","Circuit testing","Voltage measurement","Insulator testing","Q measurement","Time measurement","Laboratories","Equations","Electrical resistance measurement","Impulse testing"
  • Journal_Title
    Transactions of the American Institute of Electrical Engineers
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1933.5056349
  • Filename
    5056349
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3817623