مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3817623

Title :

Discussion

Author :

P. L. Bellaschi

Volume :

Issue :

fYear :

1933

Firstpage :

553

Lastpage :

567

Keywords :

"Surges","Circuit testing","Voltage measurement","Insulator testing","Q measurement","Time measurement","Laboratories","Equations","Electrical resistance measurement","Impulse testing"

Journal_Title :

Transactions of the American Institute of Electrical Engineers

Publisher :

ieee

ISSN :

0096-3860

Type :

jour

DOI :

10.1109/T-AIEE.1933.5056349

Filename :

5056349

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3817623