DocumentCode :
3818428
Title :
Phase congruency features for palm-print verification
Author :
V. Struc;N. Pavesic
Author_Institution :
Faculty of Electrical Engineering, University of Ljubljana, Trzaska 25, SI-1000 Ljubljana, Slovenia
Volume :
3
Issue :
4
fYear :
2009
fDate :
7/1/2009 12:00:00 AM
Firstpage :
258
Lastpage :
268
Abstract :
The existing palm-print verification schemes have demonstrated good verification performance when identity claims have to be verified based on palm-print images of adequate quality (e.g. acquired in controlled illumination conditions, free from distortions caused by the pressure applied to the surface of the scanner etc.). However, most of these schemes struggle with their verification performance when features have to be extracted from palm-print images of a poorer quality. In this study the authors present a novel palm-print feature extraction approach which deals with the presented problem by employing the two-dimensional phase congruency model for line-feature extraction. The proposed approach first computes a set of phase congruency features from a palm-print image and subsequently performs linear discriminant analysis on the computed features to represent them in a more compact manner. The approach was tested on two contrasting databases, namely, on the FE-LUKS and on the PolyU database. Encouraging results were achieved on both databases.
Journal_Title :
IET Signal Processing
Publisher :
iet
ISSN :
1751-9675
Type :
jour
DOI :
10.1049/iet-spr.2008.0152
Filename :
5137341
Link To Document :
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