DocumentCode
3818428
Title
Phase congruency features for palm-print verification
Author
V. Struc;N. Pavesic
Author_Institution
Faculty of Electrical Engineering, University of Ljubljana, Trzaska 25, SI-1000 Ljubljana, Slovenia
Volume
3
Issue
4
fYear
2009
fDate
7/1/2009 12:00:00 AM
Firstpage
258
Lastpage
268
Abstract
The existing palm-print verification schemes have demonstrated good verification performance when identity claims have to be verified based on palm-print images of adequate quality (e.g. acquired in controlled illumination conditions, free from distortions caused by the pressure applied to the surface of the scanner etc.). However, most of these schemes struggle with their verification performance when features have to be extracted from palm-print images of a poorer quality. In this study the authors present a novel palm-print feature extraction approach which deals with the presented problem by employing the two-dimensional phase congruency model for line-feature extraction. The proposed approach first computes a set of phase congruency features from a palm-print image and subsequently performs linear discriminant analysis on the computed features to represent them in a more compact manner. The approach was tested on two contrasting databases, namely, on the FE-LUKS and on the PolyU database. Encouraging results were achieved on both databases.
Journal_Title
IET Signal Processing
Publisher
iet
ISSN
1751-9675
Type
jour
DOI
10.1049/iet-spr.2008.0152
Filename
5137341
Link To Document