Title :
Learning user-specific parameters in a multibiometric system
Author :
Jain, Anil K. ; Ross, Arun
Author_Institution :
Dept. of Comput. Sci. & Eng., Michigan State Univ., USA
Abstract :
Biometric systems that use a single biometric trait have to contend with noisy data, restricted degrees of freedom, failure-to-enroll problems, spoof attacks, and unacceptable error rates. Multibiometric systems that use multiple traits of an individual for authentication, alleviate some of these problems while improving verification performance. We demonstrate that the performance of multibiometric systems can be further improved by learning user-specific parameters. Two types of parameters are considered here. (i) Thresholds that are used to decide if a matching score indicates a genuine user or an impostor, and (ii) weights that are used to indicate the importance of matching scores output by each biometric trait. User-specific thresholds are computed using the cumulative histogram of impostor matching scores corresponding to each user. The user-specific weights associated with each biometric are estimated by searching for that set of weights which minimizes the total verification error. The tests were conducted on a database of 50 users who provided fingerprint, face and hand geometry data, with 10 of these users providing data over a period of two months. We observed that user-specific thresholds improved system performance by ∼ 2%, while user-specific weights improved performance by ∼ 3%.
Keywords :
face recognition; fingerprint identification; image matching; learning systems; noise; parameter estimation; biometric trait; cumulative histogram; database; error rates; face data; failure-to-enroll problems; fingerprint data; hand geometry data; impostor; impostor matching scores; multibiometric system; noisy data; spoof attacks; system performance; total verification error minimization; user-specific parameters learning; user-specific thresholds; user-specific weights; Authentication; Biometrics; Error analysis; Fingerprint recognition; Geometry; Histograms; Impedance matching; Spatial databases; System performance; Testing;
Conference_Titel :
Image Processing. 2002. Proceedings. 2002 International Conference on
Print_ISBN :
0-7803-7622-6
DOI :
10.1109/ICIP.2002.1037958