• DocumentCode
    3825202
  • Title

    Dinosaur egg

  • Volume
    46
  • Issue
    8
  • fYear
    2009
  • Firstpage
    16
  • Lastpage
    16
  • Keywords
    "Dinosaurs","Failure analysis","Microelectromechanical systems","Integrated circuit reliability","Micromechanical devices","Optical switches","Electrostatic discharge","Art","Microscopy","Tungsten"
  • Journal_Title
    IEEE Spectrum
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.2009.5186537
  • Filename
    5186537