DocumentCode :
38272
Title :
Model-Based Prognosis for Hybrid Systems With Mode-Dependent Degradation Behaviors
Author :
Ming Yu ; Danwei Wang ; Ming Luo
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume :
61
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
546
Lastpage :
554
Abstract :
Prognosis of hybrid systems is a challenging problem because multiple faults may happen simultaneously at a mode where these faults have different detectability. In other words, at the fault-initiating mode, some of the faults are detectable while others are nondetectable. As a result, decision making based on only one observation of abnormal behavior is not reliable under this condition. This paper focuses on the development of a model-based prognosis framework for hybrid systems where a dynamic fault isolation scheme is proposed to facilitate the prognostic tasks. The degradation behavior of each faulty component is mode dependent and can be estimated by a hybrid differential evolution algorithm. Thereafter, the remaining useful life of the faulty component that varies with different operating modes is calculated by using both the estimated degradation model and the user-selected failure threshold. Experiments are carried out to validate the key concepts of the developed methods, and results suggest the effectiveness.
Keywords :
condition monitoring; evolutionary computation; failure analysis; fault diagnosis; remaining life assessment; decision making; degradation model estimation; dynamic fault isolation scheme; fault component degradation behavior; fault detection; fault diagnosis; fault initiating mode; hybrid differential evolution algorithm; mode dependent degradation behavior; model-based hybrid system prognosis; remaining useful life; user selected failure threshold; Circuit faults; Degradation; Mathematical model; Monitoring; Standards; Switches; Vectors; Degradation model; differential evolution (DE); dynamic fault isolation (DFI); failure threshold; hybrid systems; model-based prognosis; remaining useful life (RUL);
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2013.2244538
Filename :
6425465
Link To Document :
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